• DocumentCode
    1719845
  • Title

    The BaBar RadFET monitoring board

  • Author

    Camanzi, Barbara ; Crawley, H. Bert ; Holmes-Siedle, Andrew ; McKay, Roy L. ; McKemey, Adrian ; Meyer, W.T. ; Rosenberg, Eli I. ; Stelzer, Joerg ; Tinslay, Jane

  • Author_Institution
    Dept. of Electron. Eng., Brunel Univ., Uxbridge, UK
  • Volume
    4
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    2357
  • Lastpage
    2362
  • Abstract
    The monitoring board to interface the RadFET integrated radiation dosimeters to the BaBar detector control system is described. RadFET sensors are specially designed p-channel MOSFET transistors which measure lifetime integrated radiation exposure by measuring the source-drain voltage at a fixed current. As the device is irradiated, positive space charge is trapped in the oxide layer, which results in an increase in the source-drain voltage. Communication with the BaBar detector control system proceeds via a CANbus interface using a Motorola MC68HC705X32 microcontroller on the monitoring board and the BaBar standard EPICS-based tools on the BaBar side. The RadFET monitoring Board (RMB) can read up to thirty-two sensors. A manual control allows for adjustment of an offset voltage to increase the maximum readable value as the device receives more exposure, while retaining the original circuit precision. Results from monitoring during the first years of BaBar running are presented
  • Keywords
    MOSFET; dosimeters; BaBar detector; CANbus; MOSFET transistors; Motorola MC68HC705X32; RadFET dosimeters; monitoring board; source-drain voltage; space charge; Communication standards; Communication system control; Control systems; Current measurement; MOSFET circuits; Microcontrollers; Radiation detectors; Radiation monitoring; Space charge; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2001 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-7324-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2001.1009296
  • Filename
    1009296