Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers

Author

Manghisoni, M. ; Ratti, L. ; Re, V. ; Speziali, V.

Author_Institution

Ist. Nazionale di Fisica Nucl., Pavia, Italy

Volume

4

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

2372

Lastpage

2376

Abstract

High-density, high-speed CMOS and BiCMOS technologies are today widely used for the design of readout integrated circuits for room temperature X and γ-ray imaging detectors. This paper describes a laboratory instrument that was developed to characterize the noise performances of CMOS devices to be used for high speed analog signal processing. These instruments extend the noise measuring capabilities beyond 100 MHz to detect the white noise component beyond the 1/f noise corner frequency, which in shorter channel devices shifts to higher values as compared to long-channel transistors

Keywords

CMOS analogue integrated circuits; nuclear electronics; preamplifiers; readout electronics; white noise; 1/f noise corner frequency; fast detector preamplifiers; high speed analog signal processing; high-speed BiCMOS technologies; high-speed CMOS technologies; noise measuring capabilities; noise performances; readout integrated circuits; white noise component; BiCMOS integrated circuits; CMOS integrated circuits; CMOS technology; High speed integrated circuits; Instruments; Integrated circuit noise; Integrated circuit technology; Noise measurement; Optical imaging; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2001 IEEE

Conference_Location

San Diego, CA

ISSN

1082-3654

Print_ISBN

0-7803-7324-3

Type

conf

DOI

10.1109/NSSMIC.2001.1009298

Filename

1009298