• DocumentCode
    1721168
  • Title

    An on-chip IDDT current sensor based on current-to-voltage conversion

  • Author

    Gyepes, Gábor ; Arbet, Daniel ; Majer, Libor ; Stopjaková, Viera

  • Author_Institution
    Dept. of IC Design & Test, Slovak Univ. of Technol., Bratislava, Slovakia
  • fYear
    2012
  • Firstpage
    87
  • Lastpage
    90
  • Abstract
    In this paper, the dynamic supply current test (IDDT) for logic circuits is presented, where the targeted defects are weak opens in regular structures (SRAM arrays). Considerations about the current based tests are made, and a method of IDDT sensor realization is presented. The method is based on conversion of the current waveform to a voltage waveform. Also the most effective parameters of both the dynamic supply current waveform and voltage waveform are analyzed and evaluated.
  • Keywords
    SRAM chips; electric current measurement; electric sensing devices; logic circuits; SRAM array; current-to-voltage conversion; dynamic supply current test; dynamic supply current waveform; logic circuit; on-chip IDDT current sensor; voltage waveform; Circuit faults; Differential amplifiers; Logic gates; Monitoring; Random access memory; Sensors; Testing; IDDT; current test; dynamic supply current test; open defects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Electronics (AE), 2012 International Conference on
  • Conference_Location
    Pilsen
  • ISSN
    1803-7232
  • Print_ISBN
    978-1-4673-1963-8
  • Type

    conf

  • Filename
    6328906
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1721168