• DocumentCode
    1721540
  • Title

    Characterization of base current transport in polyemitter transistors using low frequency noise analysis

  • Author

    Quon, D.S. ; Sonek, G.J. ; Li, G.P.

  • Author_Institution
    University of California
  • fYear
    1994
  • fDate
    6/16/1905 12:00:00 AM
  • Firstpage
    45
  • Lastpage
    46
  • Keywords
    Analog circuits; Bipolar transistors; Circuit noise; Electron devices; Frequency; Low-frequency noise; Noise measurement; Positron emission tomography; Tunneling; White noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1994. 52nd Annual
  • Type

    conf

  • DOI
    10.1109/DRC.1994.1009409
  • Filename
    1009409
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1721540