DocumentCode
1721673
Title
Fabrication of field-emitter arrays for inductive-output amplifiers
Author
Murphy, R.A. ; Harris, C.T. ; Mathews, R.H. ; Graves, C.A. ; Hollis, M.A. ; Kodis, M.A. ; Shaw, J. ; Garven, M. ; Ngo, M.T. ; Jensen, K.L.
Author_Institution
Lincoln Lab., MIT, Lexington, MA, USA
fYear
1997
Firstpage
127
Abstract
Summary form only given. Field-emitter arrays (FEAs) are being fabricated for X-band inductive-output amplifiers, such as Twystrodes and Klystrodes. The pre-bunched electron beam supplied by a gated FEA cathode provides smaller size, increased efficiency, and faster turn-on compared to a thermionic-cathode tube. For this application, the FEAs must supply beam currents on the order of 80-100 mA and be designed so that the microwave input drive signal can be efficiently coupled to the modulating gate of the FEA. The Lincoln FEAs are fabricated using laser-interferometric lithography, which has provided high yields of Mo-tip arrays having 0.32-/spl mu/m tip-to-tip and 0.08-/spl mu/m gate-to-tip spacings. These small dimensions reduce the gate modulation voltage that is required for suitable beam modulation and improve the high-frequency performance; they represent the smallest dimensions and highest density yet reported for FEAs. Improvements in fabrication technology, testing methods, and conditioning techniques are presented that have resulted in emission currents as high as 22 mA from one quarter of an FEA cathode. The measured input impedance agrees well with theory and can be matched by appropriate techniques.
Keywords
electron beam testing; light interferometry; microwave amplifiers; photolithography; vacuum microelectronics; 0.08 mum; 0.32 mum; 22 mA; 80 to 100 mA; Klystrodes; Mo; Mo-tip arrays; Twystrodes; X-band inductive-output amplifiers; beam currents; beam modulation; conditioning techniques; emission currents; fabrication technology; field-emitter arrays; gate modulation voltage; gate-to-tip spacings; gated FEA cathode; high-frequency performance; inductive-output amplifiers; input impedance; laser-interferometric lithography; microwave input drive signal; modulating gate; pre-bunched electron beam; testing methods; thermionic-cathode tube; tip-to-tip spacings; Cathodes; Current supplies; Electron beams; Electron tubes; Fabrication; Laser beams; Masers; Optical coupling; Optical modulation; Signal design;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location
San Diego, CA, USA
ISSN
0730-9244
Print_ISBN
0-7803-3990-8
Type
conf
DOI
10.1109/PLASMA.1997.604380
Filename
604380
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