• DocumentCode
    1723223
  • Title

    Compact modeling of vertical hall-effect devices: Electrical behavior

  • Author

    Madec, Morgan ; Schell, Jean-baptiste ; Kammerer, Jean-baptiste ; Lallement, Christophe ; Hebrard, Luc

  • Author_Institution
    Inst. d´´Electron. du Solide et des Syst., Univ. de Strasbourg, Strasbourg, France
  • fYear
    2012
  • Firstpage
    213
  • Lastpage
    216
  • Abstract
    The topic of this work is the building of a design-oriented compact model of vertical Hall-effect sensors integrated in CMOS technologies. The use of such a model should facilitate the work of integrated sensors designers, permitting them to simulate the sensor, the biasing and processing electronics together with the same electrical simulator. In this paper, focus is made on the electrical behavior, i.e. the resistive behavior of a 5-contact sensor. The model is based both on theoretical considerations and on numerical simulations performed with COMSOL®. The result is a new compact model, written in Verilog-A, with 7 input terminals and 16 parameters, mainly the sensor geometry and the technology characteristics. These parameters can be easily extracted from measurements carried out on a single sensor. Our approach is validated by FEM simulations: the results obtained with the compact model exhibit an average error lower than 1% in comparison with simulations.
  • Keywords
    CMOS integrated circuits; Hall effect devices; finite element analysis; hardware description languages; integrated circuit design; magnetic sensors; 5-contact sensor; CMOS technologies; COMSOL; FEM simulations; Verilog-A; design- oriented compact model; electrical behavior; electrical simulator; integrated sensors designers; numerical simulations; resistive behavior; sensor geometry; sensor simulation; vertical Hall-effect sensors; Computational modeling; Equations; Magnetic sensors; Mathematical model; Resistors; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Circuits and Systems Conference (NEWCAS), 2012 IEEE 10th International
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4673-0857-1
  • Electronic_ISBN
    978-1-4673-0858-8
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2012.6328994
  • Filename
    6328994