Diagnosis of Realistic Defects Based on the X-Fault Model

Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling technique for complex defect mechanisms. We analyze the performance of the X-fault diagnosis for a number of defect classes leading to highly complex circuit behavior on electrical level. Experiments performed using accurate resistive- bridge and interconnect-open simulators demonstrate the superiority of X-fault diagnosis over traditional methods.