• DocumentCode
    1725067
  • Title

    Tunable microwave device: status and perspective

  • Author

    Marsan, Eric ; Gauthier, Jules ; Chaker, Mohamed ; Wu, Ke

  • Author_Institution
    Poly-Grames Res. Center, Ecole Polytechnique, Montreal, Que., Canada
  • fYear
    2005
  • Firstpage
    279
  • Lastpage
    282
  • Abstract
    State-of-the-art frequency-agile technologies such as semiconductors, micro-electro-mechanical systems (MEMS) and ferrites are briefly overviewed and compared with the emerging ferroelectric techniques such as BaxSr1-xTiO3 (BST) that are becoming an attractive candidate for designing low-cost and miniaturized tunable integrated microwave devices such as filters and phase shifters. Particularities of ferroelectric materials are summarized and difficulties in connection with the use of BST thin-films in RF monolithic circuit design are addressed. On the basis of a commercially available sol-gel process, BST thin-films have successfully been deposited on alumina substrate to fabricate metal-insulator-metal (MIM) tunable capacitors. Early results of such capacitors at the room temperature indicate that a tunable ratio (Cmax/Cmin) as high as 3.5 can be obtained over 1-6 GHz with 20 biasing voltage (34 V/μm) even though the ohmic loss remains high. This research also shows a 7% weak effect of hysteresis.
  • Keywords
    barium compounds; ferroelectric devices; ferroelectric thin films; microwave devices; sol-gel processing; strontium compounds; 1 to 6 GHz; BST; BST thin films; RF monolithic circuit design; ferrites; ferroelectric techniques; filters; metal-insulator-metal tunable capacitors; microelectromechanical systems; sol-gel process; tunable microwave device; Binary search trees; Ferroelectric materials; Frequency; MIM capacitors; Microelectromechanical systems; Micromechanical devices; Microwave devices; Microwave technology; Thin films; Tunable circuits and devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE-NEWCAS Conference, 2005. The 3rd International
  • Print_ISBN
    0-7803-8934-4
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2005.1496728
  • Filename
    1496728