• DocumentCode
    1725271
  • Title

    Yp — Ypk: Product test yield and yield dispersion indicators

  • Author

    Bostelmann, Matthias T.

  • Author_Institution
    Characterization Dept., ALTIS Semicond., Corbeil-Essonnes, France
  • fYear
    2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Product test results deliver multiple data about yield and detractors, comprising their centering and dispersions. They present a challenge for information delivery, in particular when the data ranges imply more than 3 orders of magnitude. To visualize them in a “at-a-glance” or “one-shot” dashboard, we present Yp and Ypk as a practical solution. This set of indicators Yp and Ypk is calculated relative to a best-can-do real-world reference. First examples illustrate the effectiveness of the method.
  • Keywords
    data mining; manufacturing data processing; production engineering computing; production testing; semiconductor device manufacture; Yp-Ypk; data management; data mining; information delivery; product test; semiconductor manufacturing; yield dispersion indicator; Data visualization; Dispersion; Manufacturing; Monitoring; Probes; Redundancy; Visualization; DM Data Management and Data Mining Tools; Yp Ypk; dashboard; new visualization method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference (ASMC), 2011 22nd Annual IEEE/SEMI
  • Conference_Location
    Saratoga Springs, NY
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-61284-408-4
  • Electronic_ISBN
    1078-8743
  • Type

    conf

  • DOI
    10.1109/ASMC.2011.5898189
  • Filename
    5898189