A Trial Simulation on the Cosmic Ray Induced Failure of the Long n- Length pin Diodes

This paper reports some simulation results on the cosmic ray induced failure of 3000 V-class silicon diodes using the new direct recombination model which had been used in the simulation of 600 V-class diodes [1], Distinct destruction wave forms were not reproduced. However, an unstable operating mode that was peculiar in a long n^- -length diode was found. Regarding this instability as the cause of the destruction, the curious empirical facts could be explained consistently.