• DocumentCode
    1726377
  • Title

    3D finite element simulation of the delamination behaviour of a PLCC package in the temperature cycling test

  • Author

    Van Gestel, Richard ; Schellekens, Han

  • Author_Institution
    Delft Univ. of Technol., Netherlands
  • fYear
    1993
  • Firstpage
    108
  • Lastpage
    121
  • Abstract
    A full three-dimensional finite-element simulation performed on a model similar to a PLCC plastic package is discussed. In the model three layers of special interface elements were used to simulate the delamination behavior as observed when plastic packages are being stressed by thermal cycles. The interfaces simulated are mould-leadframe leadframe-die, and die-mould. The results of this calculation are used to evaluate the changes of stress inside the package and will be used in combination with test chips capable of measuring die surface stress in further research.<>
  • Keywords
    circuit reliability; delamination; electronic engineering computing; failure analysis; finite element analysis; packaging; thermal stress cracking; 3D finite element simulation; IC package reliability; PLCC plastic package; changes of stress; delamination behaviour; die-mould; leadframe-die; mould-leadframe; temperature cycling test; Acoustic measurements; Acoustic testing; Adhesives; Delamination; Electronic packaging thermal management; Finite element methods; Microscopy; Plastic packaging; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1993. 31st Annual Proceedings., International
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-0782-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.1993.283293
  • Filename
    283293