DocumentCode
1726377
Title
3D finite element simulation of the delamination behaviour of a PLCC package in the temperature cycling test
Author
Van Gestel, Richard ; Schellekens, Han
Author_Institution
Delft Univ. of Technol., Netherlands
fYear
1993
Firstpage
108
Lastpage
121
Abstract
A full three-dimensional finite-element simulation performed on a model similar to a PLCC plastic package is discussed. In the model three layers of special interface elements were used to simulate the delamination behavior as observed when plastic packages are being stressed by thermal cycles. The interfaces simulated are mould-leadframe leadframe-die, and die-mould. The results of this calculation are used to evaluate the changes of stress inside the package and will be used in combination with test chips capable of measuring die surface stress in further research.<>
Keywords
circuit reliability; delamination; electronic engineering computing; failure analysis; finite element analysis; packaging; thermal stress cracking; 3D finite element simulation; IC package reliability; PLCC plastic package; changes of stress; delamination behaviour; die-mould; leadframe-die; mould-leadframe; temperature cycling test; Acoustic measurements; Acoustic testing; Adhesives; Delamination; Electronic packaging thermal management; Finite element methods; Microscopy; Plastic packaging; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1993. 31st Annual Proceedings., International
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-0782-8
Type
conf
DOI
10.1109/RELPHY.1993.283293
Filename
283293
Link To Document