DocumentCode
1726812
Title
Equivalent model for shielded microstrip transmission lines over lossy layered substrates
Author
Jain, Sidharath ; Song, Jiming ; Kamgaing, Telesphor ; Mekonnen, Yidnekachew
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear
2011
Firstpage
195
Lastpage
201
Abstract
An equivalent model for a lossy shielded microstrip line on layered media is constructed by replacing the layered media with a single effective medium and a detailed analysis of its validity at different frequencies and different range of dimensions has been presented for application to on chip interconnects. The relative permittivity for a single layer microstrip which results in the same propagation constant for the dominant mode as the layered one at a given frequency is considered to be the equivalent. The results show that this model is frequency independent for layered structures when the given frequency and frequency of operation are less than the transition frequency (i.e. the frequency at which there is a significant change in the equivalent dielectric constant (ϵreq)). For frequencies higher than the transition frequency the equivalent model is not frequency independent but it gives good results for the higher order mode although it is derived using the dominant mode. Also it is seen that at low frequency ϵreq depends on the layers near to the signal metal but at higher frequencies it depends on the layer with the highest value of ϵr irrespective of its location w.r.t to the metal strip.
Keywords
integrated circuit interconnections; microstrip lines; permittivity; transmission lines; chip interconnects; equivalent dielectric constant; equivalent model; layered structures; lossy layered substrates; relative permittivity; shielded microstrip transmission lines; single layer microstrip; Conductivity; Dielectric constant; Dielectric losses; Metals; Microstrip; Propagation constant; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898513
Filename
5898513
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