DocumentCode
1726919
Title
Enabling application-specific integrated circuits on limited pattern constructs
Author
Morris, Daniel ; Rovner, Vyacheslav ; Pileggi, Larry ; Strojwas, Andrzej ; Vaidyanathan, Kaushik
Author_Institution
Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2010
Firstpage
139
Lastpage
140
Abstract
Implementing sub-22nm designs using a limited set of pattern constructs can eliminate hotspot risk and can control systematic variability. Pattern regularity can incur a cell-level density penalty that is minimized or eliminated by co-optimization with circuits. More importantly, design with a limited set of pattern constructs can remove the limitations imposed by complex design rules, thus facilitating flexible synthesis of logic and memory blocks in place of hard IP.
Keywords
application specific integrated circuits; circuit optimisation; integrated circuit design; integrated memory circuits; application-specific integrated circuit; cell-level density penalty; circuit cooptimization; complex design rule; flexible synthesis; logic block; memory block; pattern constructs; pattern regularity; size 22 nm; systematic variability; Gratings; IP networks; Layout; Logic gates; Random access memory; Shape; Systematics;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology (VLSIT), 2010 Symposium on
Conference_Location
Honolulu
Print_ISBN
978-1-4244-5451-8
Electronic_ISBN
978-1-4244-5450-1
Type
conf
DOI
10.1109/VLSIT.2010.5556202
Filename
5556202
Link To Document