• DocumentCode
    1726919
  • Title

    Enabling application-specific integrated circuits on limited pattern constructs

  • Author

    Morris, Daniel ; Rovner, Vyacheslav ; Pileggi, Larry ; Strojwas, Andrzej ; Vaidyanathan, Kaushik

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2010
  • Firstpage
    139
  • Lastpage
    140
  • Abstract
    Implementing sub-22nm designs using a limited set of pattern constructs can eliminate hotspot risk and can control systematic variability. Pattern regularity can incur a cell-level density penalty that is minimized or eliminated by co-optimization with circuits. More importantly, design with a limited set of pattern constructs can remove the limitations imposed by complex design rules, thus facilitating flexible synthesis of logic and memory blocks in place of hard IP.
  • Keywords
    application specific integrated circuits; circuit optimisation; integrated circuit design; integrated memory circuits; application-specific integrated circuit; cell-level density penalty; circuit cooptimization; complex design rule; flexible synthesis; logic block; memory block; pattern constructs; pattern regularity; size 22 nm; systematic variability; Gratings; IP networks; Layout; Logic gates; Random access memory; Shape; Systematics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2010 Symposium on
  • Conference_Location
    Honolulu
  • Print_ISBN
    978-1-4244-5451-8
  • Electronic_ISBN
    978-1-4244-5450-1
  • Type

    conf

  • DOI
    10.1109/VLSIT.2010.5556202
  • Filename
    5556202