• DocumentCode
    1729624
  • Title

    Modeling of failure mechanisms for optimized MEMS CAD: design, fabrication and characterization of in situ test benches

  • Author

    Millet, O. ; Agache, V. ; Legrand, B. ; Collard, D. ; Buchaillot, L.

  • Author_Institution
    Inst. d´Electron. de Micro-electron. et de Nanotechnol., CNRS, Villeneuve d´Ascq, France
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1578
  • Abstract
    This work considers the reliability of surface microfabricated structures and particularly the dynamic response of structural layers during operations, in order to develop a statistical modelling of failure mechanisms for micro-actuator. In situ test benches have been designed and fabricated allowing to applied elementary solicitations (traction, bending and torsion) to representative samples. Gold, in situ doped polysilicon and polysilicon doped by diffusion are used as structural layers. These devices are useful to study the fatigue phenomenon. Characterization and fatigue tests have been performed in a vacuum chamber under different environmental and stimuli conditions. Moreover, a theoretical analysis using Finite Elements Method has been achieved.
  • Keywords
    CAD; bending; diffusion; elemental semiconductors; failure analysis; fatigue; finite element analysis; gold; mechanical testing; microactuators; reliability; silicon; torsion; traction; MEMS CAD; Si:Au; bending; diffusion; elementary solicitations; failure mechanisms; fatigue tests; finite elements method; gold; microactuator; polysilicon; reliability; surface microfabricated structures; torsion; traction; Design automation; Design optimization; Fabrication; Failure analysis; Fatigue; Gold; Microactuators; Micromechanical devices; Performance evaluation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7731-1
  • Type

    conf

  • DOI
    10.1109/SENSOR.2003.1217081
  • Filename
    1217081