• DocumentCode
    1730387
  • Title

    High-speed PNP PIN phototransistors in a 0.18 μm CMOS process

  • Author

    Kostov, Plamen ; Gaberl, Wolfgang ; Zimmermann, Horst

  • Author_Institution
    Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2011
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    In this work we present three speed optimized types of phototransistors built in a standard 180 nm CMOS technology without process modifications. An OPTO ASIC wafer consisting of a p+ substrate with a low doped p+ epitaxial layer on top of it is used for the implementation. The phototransistors were produced in 40×40 μm2 and 100×100 μm2 sizes. A gain in responsivity of more than 13 and bandwidths up to 50.7 MHz are achieved. As emitter followers, these phototransistors open the opportunity for application where high-speed photosensitive devices with inherent gain are needed. Possible applications are high speed opto-couplers, optical sensors, image sensors, etc.
  • Keywords
    CMOS integrated circuits; amplifiers; application specific integrated circuits; phototransistors; OPTO ASIC wafer; emitter followers; high-speed PNP pin phototransistors; image sensors; low doped p- epitaxial layer; optical sensors; optocouplers; p+ substrate; photosensitive devices; size 0.18 mum; standard CMOS technology; Bandwidth; CMOS integrated circuits; CMOS process; Capacitance; Optical variables measurement; Phototransistors; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European
  • Conference_Location
    Helsinki
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4577-0707-0
  • Electronic_ISBN
    1930-8876
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2011.6044203
  • Filename
    6044203