• DocumentCode
    1730539
  • Title

    Large-signal GaN HEMT electro-thermal model with 3D dynamic description of self-heating

  • Author

    Bernardoni, Mirko ; Delmonte, Nicola ; Sozzi, Giovanna ; Menozzi, Roberto

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Parma, Parma, Italy
  • fYear
    2011
  • Firstpage
    171
  • Lastpage
    174
  • Abstract
    This paper shows a physical approach to large-signal electro-thermal simulation of AlGaN/GaN HEMTs. The dynamic thermal behavior of the HEMT is described by a 3D network of thermal resistances and capacitances describing the physical structure of the HEMT, and including features such as the thermal boundary resistance between GaN and SiC, and the die-attach, as well as temperature non-uniformity along the gate finger. The thermal network is self-consistently coupled inside ADS with an electro-thermal large-signal model.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; thermal resistance; wide band gap semiconductors; AlGaN-GaN; HEMT physical structure; die-attach; dynamic thermal property; electro-thermal large-signal model; gate finger; large-signal HEMT electro-thermal model; self-heating 3D dynamic description; thermal boundary resistance; thermal resistance 3D network; Fingers; Gallium nitride; HEMTs; Silicon carbide; Solid modeling; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European
  • Conference_Location
    Helsinki
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4577-0707-0
  • Electronic_ISBN
    1930-8876
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2011.6044207
  • Filename
    6044207