• DocumentCode
    1730759
  • Title

    Delamination prediction in lead frame packages using adhesion measurements and interfacial fracture modeling

  • Author

    Srinivasan, Venkat ; Miller, Mikel ; Gurrum, Siva ; Zhao, Jie-Hua ; Edwards, Darvin ; Murtuza, Masood

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    2011
  • Firstpage
    1269
  • Lastpage
    1275
  • Abstract
    A combined adhesion characterization and fracture mechanics based modeling methodology has been developed to predict delamination in lead frame packages. This methodology allows experimental data from a simple adhesion test such as button shear test to be used along with the finite element model to ultimately predict whether a particular interface will fail in reliability testing. The methodology was validated using existing package reliability data across several package types, materials and package interfaces. In each case, the delamination prediction was compared to the actual occurrence of delamination post reliability testing. The validation showed that delamination could be predicted with 80-90% accuracy, depending on the interface and the temperature condition considered.
  • Keywords
    adhesion; delamination; electronics packaging; finite element analysis; fracture; reliability; testing; adhesion characterization; adhesion measurement; adhesion test; button shear test; delamination prediction; finite element model; fracture mechanics; interfacial fracture modeling; lead frame package; package reliability; reliability testing; Adhesives; Correlation; Delamination; Finite element methods; Lead; Materials; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898674
  • Filename
    5898674