• DocumentCode
    1731367
  • Title

    Electron transport in nanoscale semiconductor devices: ballistic versus quasiballistic

  • Author

    Sano, Nobuyuki

  • Author_Institution
    Inst. of Appl. Phys., Tsukuba Univ., Japan
  • fYear
    2005
  • Firstpage
    58
  • Lastpage
    61
  • Abstract
    We have briefly reviewed our recent studies of quasi-ballistic transport in nanoscale semiconductor structures. It has been demonstrated both theoretically and numerically that the scattering in the channel is inevitable in most cases because of the singularity inherent in the BTE. Since the transport mechanism imposed in the ballistic and the quasi-ballistic is rather different, the ballistic picture of electron transport is somewhat misleading. Therefore, purely ballistic transport at room temperature may not be attained in most nanoscale MOS devices.
  • Keywords
    MOSFET; ballistic transport; electron transport theory; BTE; electron transport; nanoscale semiconductor devices; nanoscale semiconductor structures; quasiballistic transport; transport mechanism; Ballistic transport; Differential equations; Distribution functions; Electrons; MOSFETs; Nanoscale devices; Physics; Scattering; Semiconductor devices; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 2005. (VLSI-TSA-Tech). 2005 IEEE VLSI-TSA International Symposium on
  • ISSN
    1930-8868
  • Print_ISBN
    0-7803-9058-X
  • Type

    conf

  • DOI
    10.1109/VTSA.2005.1497080
  • Filename
    1497080