DocumentCode
1731367
Title
Electron transport in nanoscale semiconductor devices: ballistic versus quasiballistic
Author
Sano, Nobuyuki
Author_Institution
Inst. of Appl. Phys., Tsukuba Univ., Japan
fYear
2005
Firstpage
58
Lastpage
61
Abstract
We have briefly reviewed our recent studies of quasi-ballistic transport in nanoscale semiconductor structures. It has been demonstrated both theoretically and numerically that the scattering in the channel is inevitable in most cases because of the singularity inherent in the BTE. Since the transport mechanism imposed in the ballistic and the quasi-ballistic is rather different, the ballistic picture of electron transport is somewhat misleading. Therefore, purely ballistic transport at room temperature may not be attained in most nanoscale MOS devices.
Keywords
MOSFET; ballistic transport; electron transport theory; BTE; electron transport; nanoscale semiconductor devices; nanoscale semiconductor structures; quasiballistic transport; transport mechanism; Ballistic transport; Differential equations; Distribution functions; Electrons; MOSFETs; Nanoscale devices; Physics; Scattering; Semiconductor devices; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 2005. (VLSI-TSA-Tech). 2005 IEEE VLSI-TSA International Symposium on
ISSN
1930-8868
Print_ISBN
0-7803-9058-X
Type
conf
DOI
10.1109/VTSA.2005.1497080
Filename
1497080
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