• DocumentCode
    1731441
  • Title

    A silicon die as a frequency source

  • Author

    McCorquodale, M.S. ; Gupta, B. ; Armstrong, W.E. ; Beaudouin, R. ; Carichner, G. ; Chaudhari, P. ; Fayyaz, N. ; Gaskin, N. ; Kuhn, J. ; Linebarger, D. ; Marsman, E. ; O´Day, J. ; Pernia, S. ; Senderowicz, D.

  • Author_Institution
    Silicon Freq. Control, Integrated Device Technol., Inc., Sunnyvale, CA, USA
  • fYear
    2010
  • Firstpage
    103
  • Lastpage
    108
  • Abstract
    A monolithic and unpackaged silicon die is presented as a frequency source suitable for quartz crystal resonator (XTAL) and oscillator (XO) replacement. The frequency source is referenced to a free-running, frequency-trimmed and temperature-compensated 3 GHz RF LC oscillator. A programmable divider array enables the device to provide frequencies ranging from 6 to 133 MHz. A post-processed Faraday shield contains fringing electromagnetic fields and enables the device to be delivered in unpackaged form such that it can be assembled into any package or via any assembly technique. The device dissipates approximately 2mA from a 1.8-3.3 V power supply and drifts no more than ±300ppm over all operating conditions including a panel of industry-standard reliability tests.
  • Keywords
    VHF oscillators; crystal resonators; dividing circuits; electronics packaging; elemental semiconductors; microwave oscillators; programmable circuits; silicon; Si; assembly technique; free-running frequency-trimmed RF LC oscillator; frequency 3 GHz; frequency 6 MHz to 133 MHz; frequency source; fringing electromagnetic fields; industry-standard reliability tests; monolithic silicon die; oscillator replacement; post-processed Faraday shield; programmable divider array; quartz crystal resonator; temperature-compensated RF LC oscillator; unpackaged silicon die; voltage 1.8 V to 3.3 V; Frequency control; Frequency measurement; Oscillators; Performance evaluation; Resonant frequency; Silicon; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium (FCS), 2010 IEEE International
  • Conference_Location
    Newport Beach, CA
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-6399-2
  • Type

    conf

  • DOI
    10.1109/FREQ.2010.5556366
  • Filename
    5556366