DocumentCode
1732084
Title
High humidity resistance of high-power white-light-emitting diode modules employing Ce:YAG doped glass
Author
Tsai, Chun-Chin ; Liou, Jyun-Sian ; Cheng, Wei-Chih ; Chung, Cheng-Hsun ; Chen, Ming-Hung ; Wang, Jimmy ; Cheng, Wood-Hi
Author_Institution
Dept. of Photonics, Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
fYear
2011
Firstpage
1626
Lastpage
1630
Abstract
The reliability study of thermal shock and damp heat tests for high-power white-light-emitting diode modules (WLEDMs) incorporating Ce:YAG doped glass, instead of conventional Ce:YAG doped silicone, as a phosphor layer is presented. The Ce:YAG doped glass as a phosphor layer is used for the glass to possess high transition temperature (Tg) of 750°C that can exhibit higher thermal stability and humidity resistance than conventional silicone. A comparison study of lumen loss, chromaticity shift, and transmittance loss of high-power WLEDWs with Ce:YAG doped glass and Ce:YAG doped silicone under thermal shock and damp heat tests was performed. The damp heat results showed that the high-power WLEDWs with Ce:YAG doped glass at 2~8 wt% doping concentrations exhibited 67~69%, 49~65%, and 35~67% better improvements than doped silicone for the lumen loss, chromaticity shift, and transmittance loss, respectively. The damp heat test demonstrated the larger improvement of glass doped in transmittance loss. The thermal shock results showed that the high-power WLEDWs with Ce:YAG doped glass at 2~8 wt% doping concentrations exhibited 57~68%, 53~58%, and 58~67% better improvements than doped silicone for the lumen loss, chromaticity shift, and transmittance loss, respectively. These results demonstrated that the Ce:YAG doped glass exhibited higher humidity resistance than the Ce:YAG doped silicone under damp heat and thermal shock tests. A better thermal stability and humidity resistance of doped glass phosphor layer may be beneficial to the many applications where the LED modules with high-power and high reliability are demanded.
Keywords
humidity; light emitting diodes; semiconductor device reliability; semiconductor doping; thermal shock; thermal stability; yttrium compounds; Ce:YAG doped glass; YAG:Ce; damp heat tests; high-power white-light-emitting diode modules; humidity resistance; reliability study; temperature 750 degC; thermal shock; thermal stability; Electric shock; Glass; Heating; Light emitting diodes; Phosphors; Propagation losses; Thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898729
Filename
5898729
Link To Document