• DocumentCode
    1732306
  • Title

    Thermal behaviours of silicone-based optical interconnects with mirror optical coupling

  • Author

    Cai, D.K. ; Neyer, A.

  • Author_Institution
    Fak. fur Elektrotechnik und Informationstechnik, Arbeitsgebiet Mikrostrukturtechnik (AG MST), Tech. Univ. Dortmund, Dortmund, Germany
  • fYear
    2011
  • Firstpage
    1679
  • Lastpage
    1683
  • Abstract
    The thermal stability of mirror coupling in polymer optical interconnects has been investigated by means of of the FVM (finite volume method) based software FLOTHERM. According to the approach, thermal simulations were performed to study polymer waveguides layers within polymer optical interconnects with mirror coupling solution. In the case of mirror-coupling, temperature distributions and gradients in the key waveguide layer were analyzed. With this simulated temperature distribution and the experimentally evaluated refractive indices and thermo-optic coefficients (TOC) of core and cladding silicones, the influence on the maximum data transmission capability in silicone based waveguides is discussed as well as the impact on waveguide insertion loss figures at 850 nm.
  • Keywords
    finite volume methods; mirrors; optical couplers; optical interconnections; optical polymers; optical waveguides; refractive index; silicones; thermal stability; thermo-optical effects; FLOTHERM; finite volume method; mirror coupling solution; mirror optical coupling; polymer optical interconnects; polymer waveguides layers; refractive index; silicone based optical interconnects; thermal behaviour; thermal simulations; thermal stability; thermo-optic coefficients; waveguide insertion loss; wavelength 850 nm; Optical device fabrication; Optical interconnections; Optical refraction; Optical variables control; Optical waveguides; Temperature distribution; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898737
  • Filename
    5898737