• DocumentCode
    1732310
  • Title

    Research on SoC test Compression

  • Author

    Shao, Jingbo ; Ding, Jinfeng ; Huang, Yuyan ; Zhang, Wei ; Wang, Jianhua

  • Author_Institution
    Coll. of Comput. Sci. & Inf. Eng., Harbin Normal Univ., Harbin, China
  • Volume
    1
  • fYear
    2011
  • Firstpage
    549
  • Lastpage
    552
  • Abstract
    This paper explores SoC test Compression methods, compares the advantages and disadvantages of each method, generalizes the characteristics of every approach, expounds how each method works. The situation suitable for using a specific compression method is given. And the possible prospective is pointed out.
  • Keywords
    data compression; logic testing; system-on-chip; SoC test compression method; system-on-chip; SoC; test compression; test response; tests stimuli;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Network Technology (ICCSNT), 2011 International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4577-1586-0
  • Type

    conf

  • DOI
    10.1109/ICCSNT.2011.6182017
  • Filename
    6182017
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1732310