• DocumentCode
    1732776
  • Title

    A 10-bit 1 MS/s 3-step ADC with bitstream-based sub-DAC and sub-ADC calibration

  • Author

    Pishdad, B. ; Roberts, G.W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    1
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Abstract
    A 3-step Nyquist-rate ADC is presented which makes use of bitstream techniques to design and calibrate the D/A subconverter, while using the same hardware to calibrate the A/D subconverter. The novel methods presented remove the dependence on offsets and component mismatches in the D/A subconverter. They eliminate the need for a reference ladder in the A/D subconverter and calibrate comparator offsets. In addition, DC offsets in the residue amplifier are calibrated. Simulation results of a prototype in 0.18 μ CMOS technology show 10 bits of resolution at an operating speed of 1 MS/s.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; 0.18 micron; 10 bit; A/D subconverter; CMOS technology; D/A subconverter; DC offset; amplifier; bitstream processing; calibration; comparator; component mismatch; design; three-step Nyquist-rate analog-to-digital converter; CMOS technology; Calibration; Circuits; DC generators; Frequency; Hardware; Low pass filters; Pulse modulation; Virtual prototyping; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
  • Print_ISBN
    0-7803-7448-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2002.1009887
  • Filename
    1009887