• DocumentCode
    1732904
  • Title

    Nano resolution imaging technique with a near-field scanning microwave microscope

  • Author

    Yoo, Hyunjun ; Kim, Songhui ; Yang, Jongil ; Lee, Kiejin ; Friedman, Barry

  • Author_Institution
    Dept. of Phys., Sogang Univ., Seoul, South Korea
  • Volume
    1
  • fYear
    2004
  • Firstpage
    190
  • Abstract
    We demonstrated a near-field scanning microwave microscope (NSMM) with a nano spatial resolution using a hybrid tip. In order to understand the function of the probe, we fabricated the hybrid tip with a flat shaped shoulder and a reduced length of the tapered part using a conventional chemical etching technique. Two different NSMM images were observed for patterned Cr films on glass substrates and analyzed as a function of the apex and the cone angle of the tapered part. The hybrid tips were coupled to a high quality dielectric resonator at an operating frequency f = 4.46 GHz. By using the hybrid tip, we demonstrated an improved high contrast NSMM image of lambda phage DNA on a glass substrate.
  • Keywords
    DNA; dielectric resonators; image resolution; microwave imaging; microwave measurement; near-field scanning optical microscopy; 4.46 GHz; NSMM images; chemical etching technique; cone angle; dielectric resonator; glass substrates; hybrid tip; image contrast; lambda phage DNA; nanoresolution imaging; nanospatial resolution; near-field scanning microwave microscope; patterned Cr films; Chemicals; Dielectric substrates; Etching; Glass; Image resolution; Microscopy; Microwave imaging; Microwave theory and techniques; Probes; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-8248-X
  • Type

    conf

  • DOI
    10.1109/IMTC.2004.1351025
  • Filename
    1351025