DocumentCode
1733383
Title
Lower bound for degree of sequential diagnosability of Cayley graphs
Author
Yamada, Toshinori
Author_Institution
Div. of Math., Electron. & Inf., Saitama Univ., Saitama, Japan
fYear
2010
Firstpage
1
Lastpage
4
Abstract
This paper presents that the degree of sequential diagnosability of an N-vertex Cayley graph is Ω(N/D) by generalizing a known technique of finding a lower bound for that of a CCC(cube-connected cycles), where D is the diameter of the Cayley graph. From the lower bound, it is shown that the degrees of sequential diagnosability of the N-vertex star graph and wrapped butterfly are Ω(N log log N/log N) and Ω(N/log N), respectively.
Keywords
fault simulation; graph theory; integrated circuit design; microprocessor chips; multiprocessor interconnection networks; Cayley graphs; cube connected cycles; lower bound; sequential diagnosability; Circuit faults; Hypercubes; Integrated circuit modeling; Multiprocessing systems; Program processors; Sequential diagnosis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD), 2010 XIth International Workshop on
Conference_Location
Gammath
Print_ISBN
978-1-4244-6816-4
Type
conf
DOI
10.1109/SM2ACD.2010.5672318
Filename
5672318
Link To Document