• DocumentCode
    1733653
  • Title

    Application of multi-signal modeling theory to testability analysis for complex electronic system

  • Author

    Liu, Haisong ; Wu, Jiechang ; Chen, Guojun

  • Author_Institution
    Dept. of Mech. Eng., Naval Univ. of Eng., Wuhan, China
  • Volume
    2
  • fYear
    2011
  • Firstpage
    755
  • Lastpage
    758
  • Abstract
    It is important to consider the testability problem for electronic equipment design due to the increased complication of system function and structure. Multi-signal model is akin to overlaying a set of single-signal dependency models on the structural model, which combines advantages of structure model and dependency model. Thus multi-signal modeling method is adopted to describe dependency relationship and calculate testability parameters in this paper. The testability analysis process is illustrated by a practical example of centralized engine room control system. The experimental results indicate that the multi-signal modeling based method is simple, visual and effective for testability analysis of complex electronic system.
  • Keywords
    electronic equipment testing; signal processing equipment; centralized engine room control system; complex electronic system; electronic equipment design; multisignal modeling theory; single-signal dependency models; structural model; testability analysis; Actuators; Analytical models; Silicon; complex electronic system; multi-signal model; testability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Network Technology (ICCSNT), 2011 International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4577-1586-0
  • Type

    conf

  • DOI
    10.1109/ICCSNT.2011.6182074
  • Filename
    6182074