An Improved On-chip 4-Port Parasitics De-embedding Method with Application to RF CMOS

Author

Wei, Xiaoyun ; Xia, Kejun ; Niu, Guofu ; Li, Ying ; Sweeney, Susan L. ; Liang, Qingqing ; Wang, Xudong ; Taylor, Stewart S.

Author_Institution

Dept. of Electr. & Comput. Eng., Alabama Microelectron. Sci. & Technol. Center, Auburn, AL

fYear

2007

Firstpage

24

Lastpage

27

Abstract

This paper presents an improved algorithm to solve the general 4-port parasitics de-embedding problem. Experimental results on 0.13 mum RF CMOS device are presented. For the device examined, gate resistance extracted from open-short results is 40% lower than that extracted from 4-port results. The reciprocity and symmetry of the 4-port parasitics are also examined

Keywords

CMOS integrated circuits; integrated circuit measurement; multiport networks; radiofrequency integrated circuits; 0.13 micron; 4-port parasitics; RF CMOS; on-wafer de-embedding; Algorithm design and analysis; CMOS technology; Circuit testing; Electrical resistance measurement; Equivalent circuits; Integrated circuit interconnections; Measurement standards; Microelectronics; Radio frequency; Voltage; 4-port parasitics; RF CMOS; effective gate resistance; on-wafer de-embedding;

fLanguage

English

Publisher

ieee

Conference_Titel

Silicon Monolithic Integrated Circuits in RF Systems, 2007 Topical Meeting on

Conference_Location

Long Beach, CA

Print_ISBN

0-7803-9765-7

Electronic_ISBN

0-7803-9765-7

Type

conf

DOI

10.1109/SMIC.2007.322760

Filename

4117316