• DocumentCode
    1734783
  • Title

    Functional Test and Speed/Power Sorting of the IBM POWER6 and Z10 Processors

  • Author

    Pham, Tung N. ; Clougherty, Frances ; Salem, Gerard ; Crafts, James M. ; Tetzloff, Jon ; Moczygemba, Pamela ; Skergan, Timothy M.

  • Author_Institution
    Syst. & Technol. Group Dev., IBM, NY
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The 5 GHz IBM POWER6 processor (P6) and newest Z10 4.4 GHz processor utilized a custom combination of structural and functional testing delivering improved test costs and accelerated SPQL learning over previous IBM processor generations.
  • Keywords
    microprocessor chips; IBM POWER6 processor; SPQL learning; Z10 processor; frequency 4.4 GHz; frequency 5 GHz; functional testing; speed/power sorting; Circuit faults; Circuit testing; Communication system control; Cost function; Logic arrays; Logic programming; Logic testing; Sorting; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700598
  • Filename
    4700598