Analog Test Technology: Stable and Grounded, or Open Loop and Spurious

This panel discusses a very important question of whether all the analog test problems have already been solved. The position of the author is that though considerable research work has been done on the analog test problems in past, increasing accuracy and bandwidth of ICs (integrated circuits) are posing new and more complicated problems for test engineers. Additionally, not many solutions to the analog test problems in past have found their way from the research laboratories to the production test floor. This raises the question of whether the so-called ´solved test problems´ are really solved.