• DocumentCode
    1736628
  • Title

    Application of the Pockels Effect to High Voltage Measurement

  • Author

    Long, Fei ; Zhang, Jianhuan ; Xie, Chunrong ; Yuan, Zhiwei

  • Author_Institution
    Xiamen Univ., Xiamen
  • fYear
    2007
  • Abstract
    The traditional way to measure an electric field electrically disturbs the original field, so that can cause a number of measuring problems. Using a Pockels´ crystal to measure an electric field has several advantages over electrical methods, such as interference from electromagnetic radiation, high sensitivity and wide frequency bandwidth. This paper presents a kind of new optical method for measuring electric voltage, current and power, and this new method makes the Sensing Technology on Pockels effect and optical Technology together. The study shows that this kind of method can be used to measure the electric voltage, current and power when the voltage is high and/or the current is large. And a comparison is made between transverse Pockels effect and longitudinal Pockels effect. Electric-optic effect voltage measurement system is designed based on longitudinal Pockels high-voltage measurement methods odotThese methods can applying to high-voltage levels up to 400 kV in a wide bandwidth between dc to30 MHz is developed. In addition, an excellent agreement is observed between the measured and predicted values.
  • Keywords
    Pockels effect; electric field measurement; electromagnetic wave interference; voltage measurement; Pockels crystal; Pockels effect; electric field measurement; electric voltage measurement; electric-optic effect; electromagnetic radiation interference; high voltage measurement; optical technology; Bandwidth; Current measurement; Electric variables measurement; Electromagnetic interference; Electromagnetic measurements; Electromagnetic radiative interference; Frequency measurement; Optical sensors; Power measurement; Voltage measurement; Pockels effect; high voltage; voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-1136-8
  • Electronic_ISBN
    978-1-4244-1136-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2007.4351190
  • Filename
    4351190