DocumentCode
1736904
Title
Wavelets explain the stability of Pocklington´s equation
Author
Canning, F.X.
Author_Institution
Inst. for Sci. Res., Fairmont, WV, USA
Volume
1
fYear
2003
Firstpage
350
Abstract
Several of the integral equations in everyday use for electromagnetic computations are "not well-posed" (e.g. they are ill-posed). In most other fields, solutions occur, but with arbitrarily large errors that cause serious practical problems. On the other hand, the specific ill-posed equations used in electromagnetics seem to work just fine in practice. G.C. Hsiao and R.E. Kleinman (see IEEE Trans. Antennas and Propag., vol.45, no.3, p.316-28, 1997) considered the ill-posed problem of the electric field integral equation (EFIE). It has been suggested that Pocklington\´s integral equation is even less well behaved. Our approach is two fold. We re-examine a paper (Canning, F.X. and Scholl, J.F., IEEE Trans. Antennas and Propag., vol.44, no.9, p.1239-46, 1996) which shows how wavelets can be used to improve the condition number (or stability) of the EFIE. We show how these results are equivalent to the results of Hsiao and Kleinman. These wavelet results provide a particularly clear physical picture of what is happening. The stability of the EFIE for its intended purpose becomes clear, in spite of its ill-posed nature. Second, we extend the wavelet related results of Canning and Scholl to Pocklington\´s integral equation, and explicate its stability properties.
Keywords
computational electromagnetics; electric field integral equations; numerical stability; wavelet transforms; EFIE; Pocklington equation; electric field integral equation; electromagnetic computations; ill-posed problems; stability; wavelets; Canning; Computer errors; Current measurement; Electric variables measurement; Electromagnetics; Integral equations; Moment methods; Size measurement; Stability; Wavelet domain;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location
Columbus, OH, USA
Print_ISBN
0-7803-7846-6
Type
conf
DOI
10.1109/APS.2003.1217468
Filename
1217468
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