• DocumentCode
    1737074
  • Title

    VLSI Test Exercise Courses for Students in EE Department

  • Author

    Komatsu, Satoshi

  • Author_Institution
    VLSI Design & Educ. Center, Univ. of Tokyo, Tokyo
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    In the deep sub-micron technology era, test of VLSI chips becomes much more important in the education of EE department. This paper reports a new trial of VLSI test exercise course in University of Tokyo.
  • Keywords
    VLSI; electrical engineering education; integrated circuit design; Electrical Engineering Department; University of Tokyo; VLSI test exercise courses; Circuit testing; Design engineering; Educational technology; Fabrication; Hardware; Particle measurements; System testing; System-on-a-chip; Velocity measurement; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700689
  • Filename
    4700689
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1737074