• DocumentCode
    1737220
  • Title

    Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains

  • Author

    Ye, Jing ; Wang, Fei ; Hu, Yu ; Li, Xiaowei

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Inst. of Comput. Technol., Beijing
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    A deterministic diagnosis method for multiple timing faults in scan chains is proposed. Compared to prior work, our approach can diagnose mask-effect multiple timing faults as well as conventional mixed multiple timing faults. Experimental results on ISCAS´89 benchmark circuits demonstrate that the average diagnosis resolution of two faults is less than 3.
  • Keywords
    benchmark testing; circuit testing; fault diagnosis; benchmark circuits; fault diagnosis; mask effect; multiple timing faults; scan chains; Circuit faults; Computer architecture; Content addressable storage; Dictionaries; Fault detection; Fault diagnosis; Laboratories; Test pattern generators; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700694
  • Filename
    4700694
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1737220