• DocumentCode
    1737427
  • Title

    Edge detection and automatic threshold based on wavelet transform in the VPPAW keyhole image processing

  • Author

    Liu, Zhonghua ; Wang, Qilong

  • Author_Institution
    Dept. of Welding, Harbin Inst. of Technol., China
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1048
  • Abstract
    In order to realize the feedback control for variable polarity plasma arc welding (VPPAW) formation in the weld process, the geometrical sizes of the keyhole image must be extracted. With the properties of multiscale edge through the wavelet theory, the edge points were detected by getting the maximum modulus of the gradient vector in the direction towards which the gradient vector points in the image plane. At coarse scales, the local maxima of modules have different positions and only detected the sharp edge. At fine scale, there are many maxima created by the image noise. One must integrate this multiscale information to look for the best scale where the edges are well discriminated from noises. A new method of peak analysis for threshold selection is provided. It is based on the wavelet transform which provides a multiscale analysis of the information of the histogram. Many experiments show these ways are effective for the keyhole image to get the geometry parameters of the keyhole in the real-time image processing
  • Keywords
    arc welding; control system synthesis; curve fitting; edge detection; feedback; process control; wavelet transforms; VPPAW keyhole image processing; automatic threshold; coarse scales; edge detection; feedback control; peak analysis; real-time image processing; threshold selection; variable polarity plasma arc welding; wavelet theory; wavelet transform; weld process; Feedback control; Image edge detection; Image processing; Image resolution; Object detection; Plasma materials processing; Plasma properties; Plasma welding; Signal detection; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
  • Conference_Location
    Rome
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-6401-5
  • Type

    conf

  • DOI
    10.1109/IAS.2000.881961
  • Filename
    881961