DocumentCode
1738742
Title
A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions
Author
Degraeve, R. ; Roussel, Ph ; Ogier, J.L. ; Groeseneken, G. ; Maes, H.E.
Author_Institution
IMEC
fYear
1996
fDate
1996
Firstpage
1651
Lastpage
1654
Keywords
Acceleration; Capacitors; Dielectric breakdown; Electric breakdown; Failure analysis; Integrated circuit reliability; MOS integrated circuits; Maximum likelihood estimation; Probability density function; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888183
Filename
888183
Link To Document