DocumentCode
1742346
Title
Nonparametric Markov random field model analysis of the MeasTex test suite
Author
Paget, Rupert ; Longstaff, Dennis
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Queensland Univ., Qld., Australia
Volume
3
fYear
2000
fDate
2000
Firstpage
927
Abstract
This paper looks at the nonparametric, multiscale, Markov random field (MRF) model and its application in classifying the MeasTex test suite. The MeasTex test suite is a standard by which various texture classification algorithms can be compared. Typically, today´s texture classification algorithms have been based on supervised classification, whereby all the classification classes have been predefined. We look at a new texture classification scheme, one that does not require a complete set of predefined classes. Instead our texture classification scheme is based on a significance test. A texture is classified on the basis of whether or not its statistical properties can be deemed to be from the same population of statistics as that define a training set texture. If not, texture is deemed unknown. The advantages and disadvantages of such a scheme are discussed in this paper
Keywords
Markov processes; image classification; image texture; statistical analysis; Markov random field model; MeasTex test suite; image texture; significance test; statistical analysis; texture classification; Application software; Classification algorithms; Earth; Markov random fields; Probability density function; Signal processing; Statistics; Synthetic aperture radar; Testing; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location
Barcelona
ISSN
1051-4651
Print_ISBN
0-7695-0750-6
Type
conf
DOI
10.1109/ICPR.2000.903696
Filename
903696
Link To Document