DocumentCode
1742349
Title
Wavelet based texture classification
Author
Sebe, Nicu ; Lew, Michael S.
Author_Institution
Leiden Inst. of Adv. Comput. Sci., Netherlands
Volume
3
fYear
2000
fDate
2000
Firstpage
947
Abstract
Texture are one of the basic features in visual searching and computational vision. In the literature most of the attention has been focussed on the texture features with minimal consideration of the noise models. In this paper, we investigate the problem of texture classification from a maximum likelihood perspective. We take into account the texture model, the noise distribution, and the inter-dependence of the texture features. Our investigation shows that the real noise distribution is closer to an exponential than a Gaussian distribution, and that the L1 metric has a better retrieval rate than L2. We also propose the Cauchy metric as an alternative for both the L1 and L2 metrics. Furthermore, we provide a direct method for deriving an optimal distortion measure from the real noise distribution, which experimentally provides consistently improved results over the other metrics. We conclude with results and discussions on an international texture database
Keywords
Gaussian distribution; feature extraction; image texture; maximum likelihood estimation; pattern classification; probability; wavelet transforms; Cauchy metric; Gaussian distribution; maximum likelihood estimation; noise distribution; probability; texture classification; texture database; wavelet transform; Computer science; Feature extraction; Gabor filters; Humans; Image color analysis; Image texture analysis; Spatial databases; Spatial resolution; Statistics; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location
Barcelona
ISSN
1051-4651
Print_ISBN
0-7695-0750-6
Type
conf
DOI
10.1109/ICPR.2000.903701
Filename
903701
Link To Document