DocumentCode
1744316
Title
Degradation of surface quality due to anti-reflective coating deposition on silicon solar cells
Author
Cudzinovic, M. ; Pass, T. ; Terao, A. ; Verlinden, P.J. ; Swanson, R.M.
Author_Institution
SunPower Corp., Sunnyvale, CA, USA
fYear
2000
fDate
2000
Firstpage
295
Lastpage
298
Abstract
We find that the front surface quality on back contacted silicon solar cells is degraded by the evaporative deposition of an anti-reflective coating. The degradation is most severe when an e-beam evaporation is performed, but there is still significant degradation with thermal evaporation. The surface recovers some after a forming gas anneal but is still degraded compared to before the evaporation. The degradation overwhelms and negates any forming gas anneal performed prior to the evaporation. The degradation is greatly reduced if the surface is not textured. We discuss the application of these results to our high efficiency silicon solar cells
Keywords
annealing; antireflection coatings; elemental semiconductors; silicon; solar cells; texture; Si; anti-reflective coating deposition; back contacted silicon solar cells; e-beam evaporation; forming gas anneal; front surface quality; high efficiency silicon solar cells; surface quality degradation; thermal evaporation; Annealing; Coatings; Constraint optimization; Contacts; Photovoltaic cells; Silicon; Sun; Surface texture; Testing; Thermal degradation;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.915818
Filename
915818
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