• DocumentCode
    1744316
  • Title

    Degradation of surface quality due to anti-reflective coating deposition on silicon solar cells

  • Author

    Cudzinovic, M. ; Pass, T. ; Terao, A. ; Verlinden, P.J. ; Swanson, R.M.

  • Author_Institution
    SunPower Corp., Sunnyvale, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    295
  • Lastpage
    298
  • Abstract
    We find that the front surface quality on back contacted silicon solar cells is degraded by the evaporative deposition of an anti-reflective coating. The degradation is most severe when an e-beam evaporation is performed, but there is still significant degradation with thermal evaporation. The surface recovers some after a forming gas anneal but is still degraded compared to before the evaporation. The degradation overwhelms and negates any forming gas anneal performed prior to the evaporation. The degradation is greatly reduced if the surface is not textured. We discuss the application of these results to our high efficiency silicon solar cells
  • Keywords
    annealing; antireflection coatings; elemental semiconductors; silicon; solar cells; texture; Si; anti-reflective coating deposition; back contacted silicon solar cells; e-beam evaporation; forming gas anneal; front surface quality; high efficiency silicon solar cells; surface quality degradation; thermal evaporation; Annealing; Coatings; Constraint optimization; Contacts; Photovoltaic cells; Silicon; Sun; Surface texture; Testing; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.915818
  • Filename
    915818