• DocumentCode
    1744991
  • Title

    Considerations for predicting freezeout and exhaustion under a variety of nontrivial conditions

  • Author

    Pieper, Ron ; Michael, Sherif

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Naval Postgraduate Sch., Monterey, CA, USA
  • Volume
    3
  • fYear
    2001
  • fDate
    6-9 May 2001
  • Firstpage
    477
  • Abstract
    A numerically robust method for evaluating the temperature dependent carrier concentrations and related Fermi levels has been proposed. The method is applicable to simple cases for which analytic solutions are available as well as more complex cases in which numerical methods are required due to nonstandard effects including bandgap widening, compensation and degeneracy induced by high levels of doping. The tests presented in the earlier paper [1998] did not focus on the use of the algorithm under conditions of high level doping. A degeneracy correction factor was defined as the essential ingredient in the algorithm that gauges the levels of degeneracy. For the trivial case of nondegenerate conditions the degeneracy factor is approximately one. The critical component in the application of the algorithm for degenerate conditions is to obtain a functional evaluation of the degeneracy factor in terms of normalized acceptor and donor energy level differences
  • Keywords
    Fermi level; carrier density; degenerate semiconductors; doping profiles; energy gap; Fermi levels; bandgap widening; compensation; degeneracy factor; degenerate conditions; doping levels; energy level differences; exhaustion; freezeout; functional evaluation; nondegenerate conditions; nontrivial conditions; numerically robust method; temperature dependent carrier concentrations; Algorithm design and analysis; Charge carrier processes; Doping profiles; Flowcharts; Impurities; Kelvin; Photonic band gap; Robustness; Temperature dependence; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    0-7803-6685-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2001.921351
  • Filename
    921351