DocumentCode
1745328
Title
Design on the turn-on efficient power-rail ESD clamp circuit with stacked polysilicon diodes
Author
Ker, Ming-Dou ; Chen, Tung-Yang
Author_Institution
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
4
fYear
2001
fDate
6-9 May 2001
Firstpage
758
Abstract
A novel power-rail ESD clamp circuit design by using stacked polysilicon diodes to trigger ESD protection device is proposed to achieve excellent on-chip ESD protection. Design methodology of this novel ESD clamp circuit has been derived in detail. Some controlled factors in the novel ESD clamp circuit can be exactly calculated to design a suitable ESD clamp circuit for different power supply applications. By adding this efficient power-rail ESD clamp circuit, the HBM ESD level of a CMOS IC product has been successfully improved from the original ~200 V to become ⩾3 kV
Keywords
CMOS integrated circuits; electrostatic discharge; protection; semiconductor diodes; 3 kV; CMOS IC; HBM ESD level; Si; design methodology; on-chip ESD protection device; power-rail ESD clamp circuit; stacked polysilicon diodes; turn-on efficiency; Circuits; Clamps; Diodes; Electrostatic discharge; MOS devices; Parasitic capacitance; Protection; Rails; Variable structure systems; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location
Sydney, NSW
Print_ISBN
0-7803-6685-9
Type
conf
DOI
10.1109/ISCAS.2001.922348
Filename
922348
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