• DocumentCode
    1745328
  • Title

    Design on the turn-on efficient power-rail ESD clamp circuit with stacked polysilicon diodes

  • Author

    Ker, Ming-Dou ; Chen, Tung-Yang

  • Author_Institution
    Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    4
  • fYear
    2001
  • fDate
    6-9 May 2001
  • Firstpage
    758
  • Abstract
    A novel power-rail ESD clamp circuit design by using stacked polysilicon diodes to trigger ESD protection device is proposed to achieve excellent on-chip ESD protection. Design methodology of this novel ESD clamp circuit has been derived in detail. Some controlled factors in the novel ESD clamp circuit can be exactly calculated to design a suitable ESD clamp circuit for different power supply applications. By adding this efficient power-rail ESD clamp circuit, the HBM ESD level of a CMOS IC product has been successfully improved from the original ~200 V to become ⩾3 kV
  • Keywords
    CMOS integrated circuits; electrostatic discharge; protection; semiconductor diodes; 3 kV; CMOS IC; HBM ESD level; Si; design methodology; on-chip ESD protection device; power-rail ESD clamp circuit; stacked polysilicon diodes; turn-on efficiency; Circuits; Clamps; Diodes; Electrostatic discharge; MOS devices; Parasitic capacitance; Protection; Rails; Variable structure systems; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    0-7803-6685-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2001.922348
  • Filename
    922348