Analysis and experimental characterization of idle tones in 2nd-order bandpass ΣΔ modulators-a 0.8 μm CMOS switched-current case study

Author

De la Rosa, José M. ; Perez-Verdu, Belen ; Medeiro, Fernando ; Río, Rocío Del ; Rodríguez-Vázquez, Angel

Author_Institution

Inst. de Microelectron. de Sevilla, Spain

Volume

4

fYear

2001

fDate

6-9 May 2001

Firstpage

774

Abstract

This paper analyses the tonal behaviour of the quantization noise in 2nd-order bandpass ΣΔ modulators. The analysis previously performed for lowpass modulators is extended to the bandpass case. As a result, closed-form expressions for the frequency of the idle tones are derived for different locations of the signal center frequency. The analytical results are validated through measurements from a silicon prototype realized using fully differential switched-current circuits in a standard 0.8 μm CMOS technology

Keywords

CMOS integrated circuits; integrated circuit noise; quantisation (signal); sigma-delta modulation; switched capacitor networks; 0.8 micron; CMOS fully-differential switched-current circuit; Si; idle tone; quantization noise; second-order bandpass sigma-delta modulator; CMOS technology; Computer aided software engineering; Digital modulation; Feedback loop; Performance analysis; Prototypes; Quantization; Radio frequency; Silicon; Switching circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6685-9

Type

conf

DOI

10.1109/ISCAS.2001.922352

Filename

922352