• DocumentCode
    1746385
  • Title

    Calibration of thickness measurement instruments based on twin laser sensors. Isoline bilinear look up tables

  • Author

    Spínola, Carlos ; Vázquez, M. J Martín ; Bohorquez, Alfonso Gago ; Bonelo, José M. ; Vizoso, Julio

  • Author_Institution
    Dept. de Electron., Malaga Univ., Spain
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1079
  • Abstract
    We present a procedure for the calibration of an instrument for noncontact thickness measurement of stainless steel sheets, based on a pair of triangulation laser sensors. Firstly, we carry out a general review of the architecture of this kind of instrument and of the problems associated with noncontact measurement based on commercial laser sensors in an industrial production environment. Secondly, we introduce a method for the calibration and characterization of this instrument based on the piecewise linear approximation of the isoline curves obtained in the calibration process (isoline bilinear look-up tables). We follow with a description of the searching and calculation of thickness in these types of tables
  • Keywords
    analogue-digital conversion; automatic optical inspection; calibration; computerised instrumentation; interpolation; measurement by laser beam; optical sensors; piecewise linear techniques; stainless steel; table lookup; thickness measurement; ADC; calibration; industrial production environment; interpolation; isoline bilinear look up tables; isoline curves; noncontact thickness measurement; piecewise linear approximation; planar approximation; stainless steel sheets; thickness measurement instruments; triangulation laser sensors; twin laser sensors; Calibration; Continuous production; Displacement measurement; Instruments; Particle measurements; Position measurement; Sensor arrays; Sensor phenomena and characterization; Sensor systems; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
  • Conference_Location
    Budapest
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-6646-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2001.928246
  • Filename
    928246