DocumentCode
174798
Title
Locating a Faulty Interaction in Pair-wise Testing
Author
Nagamoto, Takahiro ; Kojima, H. ; Nakagawa, Hirotoshi ; Tsuchiya, Takao
Author_Institution
Osaka Univ., Suita, Japan
fYear
2014
fDate
18-21 Nov. 2014
Firstpage
155
Lastpage
156
Abstract
This article discusses the location of faulty interactions in software testing. We propose an algorithm to generate a test suite that can be used to identify a faulty pair-wise interaction. This approach works as follows. First, a test suite is generated using an existing method for pair-wise testing. Pair-wise testing requires testing all pair-wise interactions but does not guarantee that the faulty interaction can be located. Second, pair-wise interactions that cannot be located by the test suite are enumerated. Finally, test cases are repeatedly added to the test suite until all pair-wise interactions can be located. The results of applying the algorithm to several problem instances show that the test suites obtained using the algorithm are nearly twice as large as those for ordinary pair-wise testing which does not ensure fault locating ability.
Keywords
program testing; faulty interaction location ability; faulty pair-wise interaction identification; pair-wise testing; software testing; test suite enumeration; test suite generation; Arrays; Browsers; Educational institutions; Fault diagnosis; Protocols; Prototypes; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Computing (PRDC), 2014 IEEE 20th Pacific Rim International Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-4799-6473-4
Type
conf
DOI
10.1109/PRDC.2014.26
Filename
6974782
Link To Document