• DocumentCode
    174798
  • Title

    Locating a Faulty Interaction in Pair-wise Testing

  • Author

    Nagamoto, Takahiro ; Kojima, H. ; Nakagawa, Hirotoshi ; Tsuchiya, Takao

  • Author_Institution
    Osaka Univ., Suita, Japan
  • fYear
    2014
  • fDate
    18-21 Nov. 2014
  • Firstpage
    155
  • Lastpage
    156
  • Abstract
    This article discusses the location of faulty interactions in software testing. We propose an algorithm to generate a test suite that can be used to identify a faulty pair-wise interaction. This approach works as follows. First, a test suite is generated using an existing method for pair-wise testing. Pair-wise testing requires testing all pair-wise interactions but does not guarantee that the faulty interaction can be located. Second, pair-wise interactions that cannot be located by the test suite are enumerated. Finally, test cases are repeatedly added to the test suite until all pair-wise interactions can be located. The results of applying the algorithm to several problem instances show that the test suites obtained using the algorithm are nearly twice as large as those for ordinary pair-wise testing which does not ensure fault locating ability.
  • Keywords
    program testing; faulty interaction location ability; faulty pair-wise interaction identification; pair-wise testing; software testing; test suite enumeration; test suite generation; Arrays; Browsers; Educational institutions; Fault diagnosis; Protocols; Prototypes; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing (PRDC), 2014 IEEE 20th Pacific Rim International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-6473-4
  • Type

    conf

  • DOI
    10.1109/PRDC.2014.26
  • Filename
    6974782