• DocumentCode
    1749143
  • Title

    Incorporation technology of fullerene and conductive properties of fullerite in ion tracks of polymer film

  • Author

    Berdinsky, Alexander S. ; Fink, Dietmar ; Chadderton, Lewis T. ; Krasnoshtanov, Sergey M.

  • fYear
    2001
  • fDate
    2001
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    We have shown in first test experiments that fullerite can be deposited along etched ion tracks in polymers via simple deposition technology from high concentrated solution of fullerene in toluene. We have tried to deposit semiconducting fullerite along etched in KOH solution ion tracks with several hundred nanometers diameter in polymer foil of 10 μm thickness. It has shown that fullerene was deposited inside the ion tracks thereby the randomly distributed fullerite columns were formed
  • Keywords
    electrical conductivity; etching; fullerenes; ion beam effects; particle tracks; polymer films; KOH etching; conductive properties; fullerene incorporation technology; ion track; polymer film; semiconducting fullerite; Art; Ion beams; Microelectronics; Nanobioscience; Nanoscale devices; Polymer films; Semiconductivity; Semiconductor devices; Solids; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Materials, 2001. Proceedings. 2nd Annual Siberian Russian Student Workshop on
  • Conference_Location
    Erlagol, Altai
  • Print_ISBN
    5-7782-0347-0
  • Type

    conf

  • DOI
    10.1109/SREDM.2001.939168
  • Filename
    939168