• DocumentCode
    1749991
  • Title

    Charge-compensation in barium titanate

  • Author

    Tsur, Y. ; Randall, C.A.

  • Author_Institution
    Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    151
  • Abstract
    Different charge-compensation mechanisms of aliovalent dopants on the cation sublattice of BaTiO3 are analyzed. It is argued that for most cases, more than one compensating defect should be considered. The partition between the various defects is a function of the degrees of freedom of the system, if equilibrium can be assumed. On cooling, the system is passed through two different metastable states. In the first one, the metal sublattice is frozen, and includes any metal vacancies that might be present. In the second one, the oxygen vacancies are also frozen into the anion sublattice and only electronic defects can compensate for the total ionic charge. (The aliovalent dopants are compensated in the metastable states by both frozen vacancies and electronic defects). The different options in terms of the overall A/B ratio, the oxygen partial pressure during the sintering and the dopant types and concentrations are outlined. Some important works on this subject are reviewed. The consequences of this model are discussed with examples of technological importance
  • Keywords
    barium compounds; charge compensation; sintering; vacancies (crystal); BaTiO3; aliovalent dopants; barium titanate; charge compensation; electronic defects; metastable states; sintering; vacancies; Barium; Charge carrier processes; Chemical engineering; Chemistry; Doping; Laboratories; Metastasis; Semiconductor process modeling; Temperature; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.941531
  • Filename
    941531