• DocumentCode
    1750043
  • Title

    Piezoelectric properties of PNW-PMN-PZT ceramics for high power piezoelectric transformer

  • Author

    Yoo, J.-H. ; Lee, Y.-W. ; Hwang, S.M. ; Yoon, H.S. ; Jeong, H.S. ; Kim, J.S. ; Yoo, C.-S.

  • Author_Institution
    Dept. of Electr. Eng., Semyung Univ., Chungbuk, South Korea
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    495
  • Abstract
    Piezoelectric properties of Pb1-aSra(Ni1/2W1/2)0.02 (Mn1/3Nb2/3)b(Krx, Ti y)1-0.02-bO3 ceramics added to 0.5 wt% PbO, 0.3 wt%Fe2O3 and 0.25 wt% CeO2 were investigated with the variations of a=0-0.06, b=0.05-0.07, x=0.49-0.51, and y=0.49-0.51. Mechanical quality factor, coercive field and Curie temperature with the decrease of Zr/Ti ratio were increased by the increase of tetragonality. According to the increase of PMN mol%, grain size decreased and coercive field increased. Moreover, dielectric constant and mechanical quality factor increased and Curie temperature and coercive field decreased with the increase of the substitution of Sr mol% to Pb sites. Taking into consideration the dielectric constant of 1,680, mechanical quality factor of 1,814, and temperature stability of resonant frequency of TCfr 88 at a=0.06, b=0.07, x=0.51, and y=0.49 composition ceramics, it can be concluded that this composition is the best one for piezoelectric transformer
  • Keywords
    Q-factor; ferroelectric Curie temperature; grain size; permittivity; piezoceramics; piezoelectric devices; power transformers; PbSr(NiW)TiO3-PMN-PZT; PbSrNiWTiO3-PbMgO3NbO3-PbZrO3TiO3; coercive field; curie temperature; dielectric constant; high power piezoelectric transformer; mechanical quality factor; piezoelectric ceramics; piezoelectric properties; temperature stability of resonant frequency; tetragonality; Ceramics; Dielectric constant; Grain size; Niobium; Q factor; Resonant frequency; Stability; Strontium; Temperature; Zirconium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.941605
  • Filename
    941605