Simulation of real-time flaw detecting systems performance

Author

Potapov, V.N. ; Ivanov, O.P. ; Stepanov, V.E. ; Ignatov, S.M.

Author_Institution

Kurchatov (I.V.) Inst. of Atomic Energy, Moscow, Russia

Volume

1

fYear

2000

fDate

2000

Abstract

The software package for modeling of real-time flaw detecting systems performance is described. The systems with following X-ray detectors are considered: industrial X-ray image intensifier+lens+highly sensitive digital CCD; scintillating screen+lens+CCD; one-dimensional arrays of scintillator+photodiode probes. The software package allows determination of different performances of defectoscopes: the spatial resolution, contrast sensitivity for different parameters of explored objects and different parameters of used X-ray emitter. The contribution of a scattering radiation from object and collimators in a total signal on the detector is taken into account

Keywords

X-ray applications; flaw detection; solid scintillation detectors; X-ray detectors; X-ray emitter; defectoscopes; highly sensitive digital CCD; industrial X-ray image intensifier; real-time flaw detecting systems performance; scintillating screen; spatial resolution; Charge coupled devices; Image intensifiers; Probes; Real time systems; Sensor arrays; Software packages; Spatial resolution; System performance; X-ray detectors; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2000 IEEE

Conference_Location

Lyon

ISSN

1082-3654

Print_ISBN

0-7803-6503-8

Type

conf

DOI

10.1109/NSSMIC.2000.949222

Filename

949222