Registration of Tapping and Contact Mode Atomic Force Microscopy Images

Atomic Force Microscopes can operate in multiple modes, such as contact, tapping, force-volume, etc., each mode providing different types of information about the test sample. AFM data therefore serves as an ideal candidate for data fusion applications. In practice however, different modes of scanning involve changing the scanning tip, which introduces severe mismatch between the scanned regions. Hence image registration is a key step for aligning the multiple mode data prior to data fusion. This paper presents the registration operation of data from contact and tapping modes with an aim to combine the information for investigating tissue scaffold properties from a cellular perspective.