DocumentCode
1756012
Title
Skin-Effect-Incorporated Transient Simulation Using the Laguerre-FDTD Scheme
Author
Ming Yi ; Myunghyun Ha ; Zhiguo Qian ; Aydiner, Alaeddin ; Swaminathan, Madhavan
Author_Institution
Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
61
Issue
12
fYear
2013
fDate
Dec. 2013
Firstpage
4029
Lastpage
4039
Abstract
In this paper, skin effect is incorporated into the unconditionally stable Laguerre finite-difference time-domain method for transient simulation of multiscale structures. The skin effect is modeled by imposing the surface impedance boundary condition (SIBC) to the surface of the conductor, which significantly reduces the computational effort. Two methods of applying SIBC are proposed and discussed in detail. A procedure for transferring the time-domain convolution into Laguerre domain in recursive form is also discussed. In addition, a method for embedding and de-embedding port resistors for fast simulation and accurate extraction of frequency-domain response is proposed. The results have been validated using measurements, along with the stability analysis of the two implementation methods. Simulation results from the multiscale structures are presented and are compared with measurements which show good accuracy and improved computational efficiency.
Keywords
finite difference time-domain analysis; frequency response; frequency-domain analysis; stochastic processes; transient analysis; Laguerre FDTD scheme; Laguerre domain; Laguerre finite difference time domain method; SIBC; deembedding port resistors; frequency domain response; multiscale structures; recursive form; skin effect incorporated transient simulation; stability analysis; surface impedance boundary condition; time domain convolution; Computational modeling; Conductors; Magnetic domains; Skin effect; Surface impedance; Time-domain analysis; Transient analysis; Laguerre finite-difference time-domain (Laugerre-FDTD); skin effect; surface impedance boundary condition (SIBC);
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2013.2287475
Filename
6661466
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