• DocumentCode
    1756146
  • Title

    Closed-Form and Explicit Analytical Model for Crosstalk in CMOS Photodiodes

  • Author

    Blanco-Filgueira, Beatriz ; Lopez, Pierre ; Roldan, Juan B.

  • Author_Institution
    Centro de Investig. en Tecnol. de la Informacion, Univ. of Santiago de Compostela, Santiago de Compostela, Spain
  • Volume
    60
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    3459
  • Lastpage
    3464
  • Abstract
    A closed-form and explicit 2-D analytical model for crosstalk(CTK) effects in p-n+ CMOS photodiodes for pixel design optimization has been developed in this paper. This model complements and extends a previous development describing the photocurrent because of the active area illumination along with the lateral depletion region and lateral components owing to the diffused photocarriers from the surroundings of the junction. The model has very few fitting parameters because it is physically based. Similarly, it can be of great use for CMOS image sensors designers, especially to fulfill high resolution and small area requirements by pixel size reduction. The model was validated extensively through device simulations with ATLAS and experimental data, and describes the CTK dependencies on light conditions and physical, geometrical, and process parameters.
  • Keywords
    CMOS image sensors; circuit simulation; image resolution; integrated circuit design; integrated circuit modelling; optical crosstalk; optimisation; p-n junctions; photoconductivity; photodetectors; photodiodes; photoemission; ATLAS simulation; CMOS image sensor designer; CTK effect; active area illumination; closed-form model; crosstalk effect; diffused photocarrier; explicit 2D analytical model; image resolution; lateral depletion region; p-n+ CMOS photodiode; photocurrent; pixel design optimization; pixel size reduction; Analytical models; Arrays; Fabrication; Junctions; Lighting; Photoconductivity; Semiconductor device modeling; Crosstalk(CTK); modeling; photodiodes(PDs); simulation;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2276748
  • Filename
    6583327